1. 1) J. W. Colby: Advance in X-ray analysis, Plenum Press, New York., 11 (1967), 287.
2. 2) W. Reuter: X-ray Optics and Microanalysis, University of Tokyo Press, (1972), p. 121.
3. 3) R. Castaing: Advance in electronics and electron physics, Academic Press, (1980), p. 317.
4. 4) P. Duncamb and S. J. B. Reed: Quantitative electron probe microanalysis, National Bureau of Standard Special Publication, (1966), p. 133.
5. 5) G. Springer: X-ray Optics and Microanalysis, Boulerard Saint-German Paris, (1965), p. 296.