Depth-profiling of Surface Oxide Film/Metal Systems
Author:
Affiliation:
1. Faculty of Engineering, Hokkaido University
Publisher
Japan Institute of Metals
Subject
General Engineering
Link
https://www.jstage.jst.go.jp/article/matertrans1960/26/10/26_10_747/_pdf
Reference15 articles.
1. 1) S. Hofmann: Surface & Interf. Anal., 2 (1980), 148.
2. 2) C. Lea: Met. Sci., 17 (1983), 357.
3. 3) R. N. Yasko and L. J. Fried: Rev. Sci. Inst., 43 (1972), 335.
4. 4) N. S. McIntyre and D. G. Zetaruk: J. Vac. Sci. Tech., 14 (1977), 181.
5. 5) R. G. Hart and G. W. Simmons: J. Vac. Sci. Tech., 15 (1978), 714.
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