In-situ Observation of Melt Growth Process of Bi (11\bar1) Thin Films by means of Transmission Electron Microscopy
Author:
Affiliation:
1. Department of Metallurgy, Mining College, Akita University
2. Graduate Student, Akita University
Publisher
Japan Institute of Metals
Subject
General Engineering
Link
https://www.jstage.jst.go.jp/article/matertrans1960/27/12/27_12_939/_pdf
Reference33 articles.
1. 1) For example, M. E. Glicksman: Solidification, Ed. by T. J. Hughel and G. F. Bolling, American Society for Metals, Ohio, (1971), p. 115.
2. 2) J. Chikawa: J. Crystal Growth, 24/25 (1974), 61.
3. 3) J. Chikawa and F. Sato: Defects in Semiconductor, North Holland Pub., Amsterdam, (1981), p. 317.
4. 4) O. Nittono, T. Ogawa, S. K. Gong and S. Nagakura: Japanese J. Appl. Phys., 23 (1984), L581.
5. 5) T. Kobayashi and T. Imura: Japanese J. Appl. Phys., 23 (1984), L632.
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