Investigation of Vacuum Arc-Deposited ta-C and ta-C:N Thin Films on Silicon and Stainless-Steel Foil Substrates Using Raman Spectroscopy-Reference-Cited by-同舟云学术

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Investigation of Vacuum Arc-Deposited ta-C and ta-C:N Thin Films on Silicon and Stainless-Steel Foil Substrates Using Raman Spectroscopy

Published:2022-10-01 Issue:10 Volume:63 Page:1510-1513
ISSN:1345-9678
Container-title:MATERIALS TRANSACTIONS
language:en
Short-container-title:Mater. Trans.

Author:

Barman Sanmitra¹,Neema Swarnim¹,Rana Anchal¹,Patel Arun Singh²,Chakraborti Anirban¹,Rana Abhimanyu Singh¹

Affiliation:

1. Centre for Advanced Materials and Devices (CAMD)-SoET, BML Munjal University

2. Department of Physics, Hindu College, Delhi University

Publisher

Japan Institute of Metals

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.jstage.jst.go.jp/article/matertrans/63/10/63_MT-M2022054/_pdf

Reference26 articles.

1. 1) J. Yang, L. Tang, W. Luo, S. Feng, C. Leng, H. Shi and X. Wei: ACS Appl. Mater. Interfaces 13 (2021) 4692–4702. doi:10.1021/acsami.0c18850

2. 2) X. Zhang, D. Kong, X. Li and L. Zhi: Adv. Funct. Mater. 29 (2019) 1806061. doi:10.1002/adfm.201806061

3. 3) Z. Zhang, N. Liao, H. Zhou and W. Xue: Acta Mater. 178 (2019) 173–178. doi:10.1016/j.actamat.2019.08.009

4. 4) A.C. Ferrari and J. Robertson: Phys. Rev. B 64 (2001) 075414. doi:10.1103/PhysRevB.64.075414

5. 5) K.B.K. Teo, A.C. Ferrari, G. Fanchini, S.E. Rodil, J. Yuan, J.T.H. Tsai, E. Laurenti, A. Tagliaferro, J. Robertson and W.I. Milne: Diam. Relat. Mater. 11 (2002) 1086–1090. doi:10.1016/S0925-9635(01)00591-X

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