Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Author:
Affiliation:
1. Department of Materials Science and Engineering, Kyushu University
2. Department of Engineering Sciences for Electronics and Materials, Kyushu University
3. JST-CREST
Publisher
Japan Institute of Metals
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.jstage.jst.go.jp/article/matertrans/49/9/49_MAW200828/_pdf
Reference10 articles.
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3. 3) M. Weyland: Top. Catal. 21 (2002) 175–183.
4. 4) K. Kaneko, K. Inoke, K. Sato, K. Kitawaki, H. Higashida, I. Arslan and P. A. Midgley: Ultramicroscopy 108 (2008) 210–220.
5. 5) K. Inoke, K. Kaneko, M. Weyl, P. A. Midgley, K. Higashida and Z. Horita: Acta Mater. 54 (2006) 2957–2963.
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