The Bias-Crystallization Mechanism on Structural Characteristics and Electrical Properties of Zn-In-Sn-O Film-Reference-Cited by-同舟云学术

The Bias-Crystallization Mechanism on Structural Characteristics and Electrical Properties of Zn-In-Sn-O Film

Published:2011 Issue:8 Volume:52 Page:1560-1564
ISSN:1345-9678
Container-title:MATERIALS TRANSACTIONS
language:en
Short-container-title:Mater. Trans.

Author:

Chen Kuan-Jen¹²,Hung Fei-Yi³²,Lui Truan-Sheng²,Chang Shoou-Jinn⁴,Hu Zhan-Shuo⁵

Affiliation:

1. Institute of Nanotechnology and Microsystems Engineering, The Instrument Center, National Cheng Kung University

2. Department of Materials Science and Engineering, National Cheng Kung University

3. Institute of Nanotechnology and Microsystems Engineering, Center for Micro/Nano Science and Engineering, National Cheng Kung University

4. Institute of Microelectronics & Department of Electrical Engineering, Center for Micro/Nano Science and Engineering, National Cheng Kung University

5. Institute of Electro-Optical Science and Engineering, Center for Micro/Nano Science and Technology, National Cheng Kung University

Publisher

Japan Institute of Metals

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.jstage.jst.go.jp/article/matertrans/52/8/52_M2011072/_pdf

Reference27 articles.

1. 1) C. A. Hoel, T. O. Mason, J. F. Gaillard and K. R. Poeppelmeier: Chem. Mater. 22 (2010) 3569–3579.

2. 2) K. Tominaga, H. Fukumoto, K. Kondou, Y. Hayashi, K. Murai, T. Moriga and I. Nakabayashi: Vacuum 74 (2004) 683–687.

3. 3) T. Dutta, P. Gupta, V. Bhosle and J. Narayan: J. Appl. Phys. 105 (2009) 053704.

4. 4) T. Minami: Thin Solid Films 516 (2008) 1314–1321.

5. 5) G. S. Heo, Y. Matsumoto, I. G. Gim, J. W. Park, K. Y. Kim and T. W. Kim: Solid State Commun. 149 (2009) 1731–1734.

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