Development of X-ray Diffractometer for High Temperature Analysis.-Reference-Cited by-同舟云学术

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Development of X-ray Diffractometer for High Temperature Analysis.

Published:1995 Issue:6 Volume:34 Page:783-785
ISSN:1340-2625
Container-title:Materia Japan
language:ja
Short-container-title:Materia Japan

Author:

Fujimura Toru,Shimomura Jun-ichi,Gomi Shuji,Katayama Michio,Kobayashi Yuji

Publisher

Japan Institute of Metals

Subject

General Medicine

Link

https://www.jstage.jst.go.jp/article/materia1994/34/6/34_6_783/_pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of a Time-Resolved In-Situ XRD System for Structural Characterization of Gas Storage Materials;Journal of the Japan Institute of Metals;2005

2. In Situ Observation Technique of High-temperature Reactions Using a New Image-plate System at Synchrotron Radiation;Tetsu-to-Hagane;1999

3. In-situ high temperature X-ray diffraction study of Cu/Al2O3 interface reactions;Acta Materialia;1998-05

4. In-situ high temperature X-ray diffraction study of Ni/Al2O3 interface reactions;Acta Materialia;1997-12

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