1. 1) S. Yang, D. Xiang, A. Bryant, P. Mawby, L. Ran, and P. Tavner: "Condition monitoring for device reliability in power electronic converters: A review," IEEE Transactions on Power Electronics, Vol. 25, No. 11, pp. 2734–2752, 2010
2. 2) R. Moeini, P. Tricoli, H. Hemida, and C. Baniotopoulos: "Increasing the reliability of wind turbines using condition monitoring of semiconductor devices: a review," IET Renewable Power Generation, Vol. 12, No. 2, pp. 182–189, 2018
3. 3) A. Hanif, Y. Yu, D. DeVoto, and F. Khan: "A comprehensive review toward the state-of-art in failure and lifetime predictions of power electronic devices," IEEE Transactions on Power Electronics, Vol. 34, No. 5, pp. 4729–4746, 2019
4. 4) R. Bayerer, T. Herrmann, T. Licht, J. Lutz, and M. Feller: "Model for power cycling lifetime of IGBT modules – various factors influencing lifetime," Proceedings of the 5th International Conference on Integrated Power Systems, 2008
5. 5) G. Zeng, L. Borucki, O. Wenzel, O. Schilling, and J. Lutz: "First results of development of a lifetime model for transfer molded discrete power devices," International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM Europe 2018), pp. 706–713, 2018