Influence of Load on Reliability of Storage Area Networks

Author:

Lv Guixiang1,Xing Liudong2

Affiliation:

1. Department of Electrical and Computer Engineering, University of Massachusetts, Dartmouth, MA, USA

2. Department of Electrical and Computer Engineering, University of Massachusetts, Dartmouth, MA, USA.

Abstract

During the coronavirus pandemic, telecommuting is widely required, making remote data access grow significantly. This requires highly reliable data storage solutions. Storage area networks (SANs) are one of such solutions. To guarantee that SANs can deliver the desired quality of service, cascading failures must be prevented, which occur when a single initial incident triggers a cascade of unexpected failures of other devices. One such incident is the data loading/overloading, causing the malfunction of one device and further cascading failures. Thus, it is crucial to address influence of data loading on the SAN reliability modeling and analysis. In this work, we make contributions by modeling the effects of data loading on the reliability of an individual switch device in SANs though the proportional-hazards model and accelerated failure-time model. Effects of loading on the reliability of the entire SAN are further investigated through dynamic fault trees and binary decision diagrams-based analysis of a mesh SAN system.

Publisher

International Journal of Mathematical, Engineering and Management Sciences plus Mangey Ram

Subject

General Engineering,General Business, Management and Accounting,General Mathematics,General Computer Science

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Static and Dynamic Load-Triggered Cascading Failure Mitigation for Storage Area Networks;International Journal of Mathematical, Engineering and Management Sciences;2024-08-01

2. Internet of Things support reliability;Reliability and Resilience in the Internet of Things;2024

3. Load Redistribution-based Reliability Enhancement for Storage Area Networks;International Journal of Mathematical, Engineering and Management Sciences;2023-02-01

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