SnO-reinforced silicate glasses and utilization in gamma-radiation-shielding applications

Author:

Rammah Yasser Saad1,Kumar Ashok2,Mahmoud Karem Abdel-Azeem3,El-Mallawany Raouf1,El-Agawany Fouad Ismail1,Susoy Gulfem4,Tekin Huseyin Ozan5

Affiliation:

1. Physics Department, Faculty of Science, Menoufia University, Shebin El-Koom, Egypt

2. University College, Benra-Dhuri, Sangrur, India; Department of Physics, Punjabi University, Patiala, India

3. Ural Federal University, Yekaterinburg, Russia; Nuclear Materials Authority, Cairo, Egypt

4. Department of Physics, Faculty of Science, Istanbul University, Istanbul, Turkey

5. Medical Diagnostic Imaging Department, College of Health Sciences, University of Sharjah, Sharjah, UAE

Abstract

The influence of tin (II) oxide (SnO) on the γ-ray radiation-protection characteristics of binary silicate glass samples with the form (100 − x)SiO2–xSnO, 40 mol% ≤ x ≤ 60 mol%, was investigated. The density and molar volume of the glasses were determined. The values of μ/ρ (mass attenuation coefficients in cm2/g) of the investigated glasses were evaluated by using the XCOM software and Monte Carlo N-Particle Transport 5 simulation in the energy range of 0.015–15.000 MeV. The obtained values of μ/ρ show good agreement between the two methods. In terms of μ/ρ, several gamma ray protection parameters, such as half-value layer, mean free path, effective atomic number, exposure build-up factor (EBF) and energy absorption build-up factor (EABF), were calculated. The results revealed that the μ/ρ values of all samples can be arranged in the order SiSn60 > SiSn55 > SiSn50 > SiSn45 > SiSn40. The results showed that the half-value layers of the investigated samples were in the order SiSn40 > SiSn45 > SiSn50 > SiSn55 > SiSn60. The values of EBF and EABF show proportionate variations with the photon energy and chemical composition of the glasses. Therefore, the investigated glasses can be considered satisfactory materials for gamma ray protection, particularly the SiSn60 sample, with 60 mol% tin (II) oxide.

Publisher

Thomas Telford Ltd.

Subject

Condensed Matter Physics,General Materials Science

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