Transmission Electron Microscopy in Conjunction with Internal Friction Measurements. A Powerful Tool for Characterization of Ceramic Interfaces.-Reference-Cited by-同舟云学术

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Transmission Electron Microscopy in Conjunction with Internal Friction Measurements. A Powerful Tool for Characterization of Ceramic Interfaces.

Published:1999 Issue:1249 Volume:107 Page:801-813
ISSN:0914-5400
Container-title:Journal of the Ceramic Society of Japan
language:en
Short-container-title:J. Ceram. Soc. Japan

Author:

KLEEBE Hans-Joachim¹,PEZZOTTI Giuseppe²

Affiliation:

1. Materials Research Institute (IMA-I), University of Bayreuth

2. Department of Materials, Kyoto Institute of Technology

Publisher

Ceramic Society of Japan

Subject

Materials Chemistry,Condensed Matter Physics,General Chemistry,Ceramics and Composites

Link

http://www.jstage.jst.go.jp/article/jcersj1988/107/1249/107_1249_801/_pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-Temperature Stiffness and Damping Measurements to Monitor the Glassy Intergranular Phase in Liquid-Phase-Sintered Silicon Carbides;Journal of the American Ceramic Society;2005-05-26

2. An irreversible disappearance of the mechanical loss peak of an yttria-doped silicon nitride;Journal of Materials Research;2004-09

3. Assessment of the high temperature elastic and damping properties of silicon nitrides and carbides with the impulse excitation technique;Journal of the European Ceramic Society;2002-01

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