Artifact Correction in Temperature-Dependent Attenuated Total Reflection Infrared (ATR-IR) Spectra
Author:
Affiliation:
1. Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA
2. Danimer Scientific, Bainbridge, GA, USA
Abstract
Publisher
SAGE Publications
Subject
Spectroscopy,Instrumentation
Link
http://journals.sagepub.com/doi/pdf/10.1177/0003702817690408
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