Luminous intensity correction method for misalignment-induced measurement error of light-emitting diode arrays

Abstract

To eliminate axial misalignment-induced measurement errors of discrete light-emitting diode arrays in the far-field condition, a robust and effective method for correcting the measured luminous intensity distribution is proposed. The precision of the correction can be determined beforehand by setting a criterion which can also be used to determine the required test distance. To validate the feasibility and practicability of the proposed approach, numerical simulations of light-emitting diode arrays with three kinds of typical luminous intensity distributions were performed. In addition, the test distances as a function of the light-emitting diode luminous intensity distribution, packing density and dimensions under translational misalignment were analysed. Some beneficial operating methods and rules for practical application are summarised. Finally, physical measurements of several experimental examples were collected. The correction results agreed with the desired data and again proved the utility of the presented method.