Binary decision diagram-based reliability evaluation of k-out-of-(n + k) warm standby systems subject to fault-level coverage
Author:
Affiliation:
1. School of Reliability and Systems Engineering, Beihang University, Beijing, China
2. Dongling School of Economics and Management, University of Science and Technology Beijing, Beijing, China
3. University of Massachusetts, Dartmouth, MA, USA
Abstract
Publisher
SAGE Publications
Subject
Safety, Risk, Reliability and Quality
Link
http://journals.sagepub.com/doi/pdf/10.1177/1748006X13485562
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