A study on obsolescence resolution profiles

Author:

Rojo F J Romero1,Roy R1,Shehab E1,Cheruvu K1

Affiliation:

1. Decision Engineering Centre, Manufacturing Department, Cranfield University, Cranfield, UK

Abstract

This paper presents a study assessing the probability of selecting a resolution approach to tackle an obsolescence issue. First, the Delphi method was applied across an industry expert panel to derive a set of 15 obsolescence resolution profiles (ORPs). The ORPs represent the probability of using each obsolescence resolution approach to tackle an obsolescence issue. Each ORP is characterized by the complexity level of the obsolete component and the level of proactiveness for obsolescence management, which have been identified as the two major factors that influence the probability of using each resolution approach. Second, the results were enhanced by means of a definitions refinement workshop. Finally, the ORPs were refined and validated by means of a workshop with experts based on the theoretical trends expected for each resolution probability. More than 40 experts in obsolescence from across the UK from the defence, aerospace, railway and nuclear sectors have participated in the study.

Publisher

SAGE Publications

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Inventory sizing of components at risk of obsolescence or shortage using genetic algorithm;Procedia CIRP;2023

2. An Approach to Obsolescence Forecasting based on Hidden Markov Model and Compound Poisson Process;International Journal of Industrial Engineering and Operations Management;2019-12-31

3. Continuous maintenance and the future – Foundations and technological challenges;CIRP Annals;2016

4. Forecasting technology and part obsolescence;Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture;2015-08-18

5. TOMCAT: An Obsolescence Management Capability Assessment Framework;Journal of Physics: Conference Series;2012-05-28

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