Research on a novel linearity amending system for the precise film potentiometer

Abstract

This article presents a novel linearity amending system for the precise film potentiometer. The proposed mathematical model for this film resistor can accurately describe the electrical characteristics of the potentiometer and estimate the thickness of carbon film, which is the source of linearity error. The voltage–position curve is measured first to model each unique potentiometer. Due to the noise and interference, the detected data have some outliers in the measurement. Next, a new algorithm to process the outliers of the data is proposed, which can identify and eliminate the noise interference. Finally, a cut profile is given to modify the linearity of potentiometer based on the model. The laser fixing robot was developed to check and improve the linearity of potentiometer, with the laser processing technology, to remove the redundant parts. Experiments illustrate the proposed method.