Nonlinear analysis of a crack in 2D piezoelectric semiconductors with exact electric boundary conditions

Author:

Zhao MingHao123,Li XinFei1,Lu Chunsheng4ORCID,Zhang QiaoYun135ORCID

Affiliation:

1. School of Mechanics and Safety Engineering, Zhengzhou University, Zhengzhou, Henan, People’s Republic of China

2. School of Mechanical Engineering, Zhengzhou University, Zhengzhou, Henan, People’s Republic of China

3. Henan Key Engineering Laboratory for Anti-fatigue Manufacturing Technology, Zhengzhou University, Zhengzhou, Henan, People’s Republic of China

4. School of Civil and Mechanical Engineering, Curtin University, Perth, Western Australia, Australia

5. Zheng Zhou Research Institute of Mechanical Engineering, Zhengzhou, Henan, People’s Republic of China

Abstract

In this paper, taking the exact electric boundary conditions into account, we propose a double iteration method to analyze a crack problem in a two-dimensional piezoelectric semiconductor. The method consists of a nested loop process with internal and outside circulations. In the former, the electric field and electron density in governing equations are constantly modified with the fixed boundary conditions on crack face and the crack opening displacement; while in the latter, the boundary conditions on crack face and the crack opening displacement are modified. Such a method is verified by numerically analyzing a crack with an impermeable electric boundary condition. It is shown that the electric boundary condition on crack face largely affects the electric displacement intensity factor near a crack tip in piezoelectric semiconductors. Under exact crack boundary conditions, the variation tendency of the electric displacement intensity factor versus crack size is quite different from that under an impermeable boundary condition. Thus, exact crack boundary conditions should be adopted in analysis of crack problems in a piezoelectric semiconductor.

Funder

National Natural Science Foundation of China

Publisher

SAGE Publications

Subject

Mechanical Engineering,General Materials Science

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3