Short Forms of the Stanford-Binet Intelligence Scale: Fourth Edition for Screening Potentially Gifted Preschoolers

Abstract

Seven different short forms from the Stanford-Binet: Fourth Edition (SB:FE) were evaluated for use as screening instruments for high ability with a sample of 199 potentially gifted preschoolers. The seven abbreviated tests were extracted from one administration of the full test. Overall, reliability and validity coefficients for the short forms were uniformly excellent (ranging from .88 to .96 for reliability and .80 to .98 for correlations between short form and full test). Mean differences between all short forms and the full test Composite were small (ranging from 0.1 to 2.3 points). Screening cut scores were generated for all seven short forms using two different methods. Short-form cut scores were then compared to the full test in a classification analysis. Overall, a four-subtest short form consisting of Vocabulary, Pattern Analysis, Quantitative, and Memory for Sentences was recommended as the best for screening purposes, offering consistently excellent psychometric properties and a significantly shorter administration time.