Patterns Detection in SAED Images of Transmission Electron Microscopy-Reference-Cited by-同舟云学术

Patterns Detection in SAED Images of Transmission Electron Microscopy

Published:2020-12-17 Issue: Volume: Page:paper63-1-paper63-11
ISSN:
Container-title:Proceedings of the 30th International Conference on Computer Graphics and Machine Vision (GraphiCon 2020). Part 2
language:en
Short-container-title:

Author:

Nebaba Stepan¹^ORCID,Zavyalov Dmitry¹^ORCID,Pak Alexander¹^ORCID

Affiliation:

1. Tomsk Polytechnic University

Abstract

Specialized software that supports existing approaches to processing images of the crystal structure of materials for analyzing transmission electron microscopy images have a lot of different digital image processing methods, but major part of it are weakly automated. Automatic algorithm is able to make the crystal structure analysis more fast and effective process. The paper considers the problem of automated processing of SAED images of transmission electron microscopy. Proposed automated image processing algorithm based on methods of adaptive binarization and Watershed segmentation allows one to determine the distances on the diffraction pattern of a material sample on the image of transmission electron microscopy. The proposed algorithm has been tested on several SAED images, distances were calculated in automatic mode and compared with the results of semi-automatic measurement in Digital Micrograph GMS 1.8 software. The analysis of the results showed high agreement in considered cases, which let us assume that proposed algorithm has good development prospects.

Funder

Russian Foundation for Basic Research

Publisher

MONOMAX Limited Liability Company

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