Evaluation of a total reflection set-up by an interface geometric model-Reference-Cited by-同舟云学术

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Evaluation of a total reflection set-up by an interface geometric model

Published:2003 Issue:12 Volume:113 Page:520-526
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Delgado M.,Delgado E.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Principles of Optics;Born,1980

2. Optics of Thin Films;Knittl,1976

3. Óptica electromagńetica;Cabrera,1999

4. Goos-Haenchen beam shift at total internal reflection;Seshadri;J. Opt. Soc. Am.,1988

5. Beam displacement at total reflection: The Goos-Haenchen Effect II;Lotsch;Optik,1970

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1. Goos-Hänchen effect observed for focused x-ray beams under resonant mode excitation;Optics Express;2017-07-12

2. Effect of surface roughness on the Goos-Hänchen shift;Physical Review A;2016-04-13

3. Influence of fiber design on light-guidance in step-index fibers for bundle applications in the UV-VIS-region;SPIE Proceedings;2014-05-02

4. Optics and Quantum Mechanics;A Trajectory Description of Quantum Processes. I. Fundamentals;2012

5. Analysis of triangular ring resonator using microcavity SOI slot waveguides;SPIE Proceedings;2011-02-10

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