Electrical Properties of CdFeSe, CdMnTe Epitaxial Films-Reference-Cited by-同舟云学术

Electrical Properties of CdFeSe, CdMnTe Epitaxial Films

Published:2022-06-06 Issue: Volume:13 Page:23`-26
ISSN:2415-1513
Container-title:WSEAS TRANSACTIONS ON ELECTRONICS
language:en
Short-container-title:

Author:

M. A. Mehrabova¹,N. H. Hasanov²,V. G. Guluzade³,R. M. Sadigov⁴

Affiliation:

1. Institute of Radiation Problems, Azerbaijan National Academy of Sciences, 1143, B.Vahabzade, 9, Baku, AZERBAIJAN

2. Baku State University, 1148, Z.Khalilov, 23, Baku, AZERBAIJAN

3. Azerbaijan Technical University, 1073, H. Javid ave. 25, Baku, AZERBAIJAN

4. Institute of Physics, Azerbaijan National Academy of Sciences, 1143, H.Javid ave. 131, Baku, AZERBAIJAN

Abstract

Optimal conditions of obtaining perfect Cd1–xFexSe (x<0.08) and Cd1-xMnxTe (x=0.15) epitaxial films are defined. The electrical properties of Cd1–xFexSe (x<0.08) and Cd1-xMnxTe (x=0.15) epitaxial films have been studied at room temperature. It was defined that Cd1–xFexSe semimagnetic semiconductor epitaxial films are of n-type and Cd1-xMnxTe p-type. Electrical resistivity was defined 14.4 ·107 Ohm⋅cm. The effect of γ-irradiation on VAC of Cd1-xMnxTe epitaxial films is studied at doses Dγ ≤ 1.5 кGy.

Publisher

World Scientific and Engineering Academy and Society (WSEAS)

Subject

Electrical and Electronic Engineering

Reference10 articles.

1. Furdyna J Diluted magnetic semiconductors. J. Appl. Phys. 64, 1988, pp.R29

2. Wei S.H., Zunger A. Total energy and band structure calculations for the semimagnetic Cd1−xMnxTe semiconductor alloy and its binary constituents. Phys. Rev. Β. 35, 1987, pp. 2340

3. Masek J., Velicki B. Mn 3d states in photoelectron spectra from Cd1−xMnxTe. Phys. Status Solidi B. 140, 1987, pp. 135

4. Twardowski A. Magnetic properties of Fe based diluted magnetic semiconductors. J. Appl. Phys. 67, 9, 1990, pp 5108-5113

5. Becker W.M. Band structure and optical properties of wide-gap AII 1-xMnxB VI alloys at zero magnetic field. Semiconductors and Semimetals. 25, 1988, pp. 35