Test generation algorithm for the All-Transition-State criteria of Finite State Machines

Abstract

In the current article a novel test generation algorithm is presented for deterministic finite state machine specifications based on the recently introduced All-Transition-State criteria. The size of the resulting test suite and the time required for test suite generation are investigated through analytical and practical analyses and are also compared to the Transition Tour, Harmonized State Identifiers and random walk test generation methods. The fault detection capabilities of the different approaches are also investigated with simulations applying randomly injected transfer faults.