Reply by the authors (D. V. Thiel and I. J. Chant) to J. R. Wait

Abstract

In his discussion of our paper Wait refers to the effect of an elliptically polarized radiation source on both electric field wavetilt and surface impedance measurements. If such measurements are made at the surface of a uniform isotropic half‐space, then both the horizontal electric and horizontal magnetic field strengths measured will depend upon the characteristics of the polarization ellipse and the orientation of the antennas whereas the vertical electric field strength is independent.