Affiliation:
1. Esso Production Research Co., Houston, Texas 77001
Abstract
Subsurface layer thicknesses and velocities may be obtained from reverse refraction profiles or by special groupings of traces which effectively fabricate synthetic reverse profiles. Especially in offshore areas, and elsewhere, single‐ended profiles are normally used for data gathering. A method for determining refraction information directly from these single‐ended profiles has been developed, which eliminates the need for special field procedures or data handling when refraction information is desired. A comparison of the expected errors from this and the conventional method is given. Finally, an example of static corrections derived by applying this method to the first arrivals of ordinary reflection data is shown.
Publisher
Society of Exploration Geophysicists
Subject
Geochemistry and Petrology,Geophysics
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献