Tuning effects of a thin layer with triclinic anisotropy

Author:

Jin Song1ORCID,Hu Xiangyun1ORCID,Li Xuelei2ORCID,Stovas Alexey3ORCID

Affiliation:

1. China University of Geosciences, School of Geophysics and Geomatics, Hubei Subsurface Multi-scale Imaging Key Laboratory, Wuhan, China. (corresponding author).

2. Hunan University of Technology and Business, School of Microelectronics and Physics, Changsha, China. .

3. Norwegian University of Science and Technology (NTNU), Department of Geoscience and Petroleum, Trondheim, Norway. .

Abstract

Tuning effects, induced by the interference between scattering waves at the top and bottom interfaces, characterize the dependence of thin-layer seismic responses on wave frequencies, thin-layer thicknesses, and medium elastic properties. The characteristics of tuning effects are frequently used to infer thin-layer properties. We analyze the tuning effects of a thin triclinic layer between two varying triclinic half-spaces. Exact thin-layer reflection and transmission (R/T) coefficients are developed to characterize the prestack thin-layer tuning effects of P, S1, and S2 waves. The thin-layer R/T coefficient approximations are developed to build concise relationships between tuning effect characteristics and medium parameters. The relationships give insights when estimating thin-layer properties from interpreting tuning effect characteristics. As inferred from the approximations, the tuning effect of a thin triclinic layer is composed of two fundamental tuning effects that make sense for two particular thin-layer models wherein one has identical enclosing half-spaces and the other has identical elastic parameter discontinuities at the bottom and top interfaces. The combined influence of wave frequencies, thin-layer thicknesses, and incidence angles on the two fundamental tuning effects can be assessed by a unique factor for each wave mode. For a general thin triclinic layer, this factor characterizes the periodic variations of reflection amplitudes versus wave frequencies. The maximum and minimum thin-layer reflection amplitudes are determined by the reflectivities at the top and bottom interfaces. With wave frequencies or thin-layer thicknesses increasing from zero, thin-layer reflections have smaller or larger amplitudes when the two single-interface reflectivities have equal or opposite polarities, respectively. We develop a method to evaluate the sensitivity of thin-layer reflection amplitudes to thin-layer elastic parameters. The sensitivity is higher when the two single-interface reflectivities have opposite polarities compared with the equal-polarity case. Numerical tests are used to demonstrate our approximation accuracy and the characteristics of tuning effects.

Funder

GAMES project at NTNU

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities, China University of Geosciences

China Postdoctoral Science Foundation

Publisher

Society of Exploration Geophysicists

Subject

Geochemistry and Petrology,Geophysics

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