Test ideals and base change problems in tight closure theory

Author:

Aberbach Ian,Enescu Florian

Abstract

Test ideals are an important concept in tight closure theory and their behavior via flat base change can be very difficult to understand. Our paper presents results regarding this behavior under flat maps with reasonably nice (but far from smooth) fibers. This involves analyzing, in depth, a special type of ideal of test elements, called the CS test ideal. Besides providing new results, the paper also contains extensions of a theorem by G. Lyubeznik and K. E. Smith on the completely stable test ideal and of theorems by F. Enescu and, independently, M. Hashimoto on the behavior of F F -rationality under flat base change.

Publisher

American Mathematical Society (AMS)

Subject

Applied Mathematics,General Mathematics

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. On the equality of test ideals;Advances in Mathematics;2024-04

2. The theory of F-rational signature;Journal für die reine und angewandte Mathematik (Crelles Journal);2024-03-23

3. Finitistic test ideals on numerically Q-Gorenstein varieties;Journal of Algebra;2021-04

4. Strong test ideals associated to Cartier algebras;Journal of Algebra and Its Applications;2019-03-08

5. On the existence of -thresholds and related limits;Transactions of the American Mathematical Society;2018-03-19

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