1. 1) A. Miyamoto and T. Honda : Development of Surface/Embedded Particle Classification Algorithm for SEM-ADC, IEICE Transaction on Information & Systems, J91-D, 6, (2008), 1604.
2. 2) T. Oshima, S. Kimoto and T. Suganuma : Stereomicrography with a Scanning Electron Microscope, Photogrammetric Engineering, 36, (1970), 874.
3. 3) G. Koenig, W. Nickel, J. Storl, D. Meyer, and J. Stange : Digital Stereophotogrammetry for Processing SEM Data, Scanning, 9, (1987), 185.
4. 4) O. V. Kholodilov, A. Ya. Grigoryev and N. K. Myshkin : Reconstruction of true topographies of solid surfaces in scanning electron microscopes using secondary electrons, Scanning, 9, (1987), 156.
5. 5) J. Lebiedzik : An Automatic Topographical Surface Reconstruction in the SEM, Scanning, 2, (1979), 230.