1. 1) David Y. Lou, A. Martinez, and D. Stanton : Surface profile measurement with a dual-beam optical system, Applied Optics, 23, 5 (1984) 746.
2. 2) Gerd Häusler, Werner Heckel : Light sectioning with large depth and high resolution, Applied Optics, 27, 24 (1988) 5165.
3. 9) Akira Hirabayashi, Hidemitsu Ogawa, Katsuichi Kitagawa : Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithm, Proc. SPIE 4451, Optical Manufacturing and Testing IV (2001) 356.
4. 10) J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio : Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses, Applied Optics, 13, 11 (1974) 2693.
5. 12) Mitsuo Takeda, Hideki Ina, and Seiji Kobayashi : Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry, JOSA, 72, 1 (1982) 156.