1. CMOS Electronics
2. The use of light emission in failure analysis of CMOS ICs,;Hawkins,1990
3. Intrinsic leakage in low power deep submicron CMOS ICs,;Keshavarzi,1997
4. Defect Classes – An overdue paradigm for CMOS IC testing,;Hawkins,1994
5. Current vs. logic testing of gate oxide short, floating gate, and bridging failures in CMOS,;Rodriguez-Montanes,1991