1. DuPont EKC265™ PERR as a Copper Metallization Etchant for the Physical Deprocessing of Failing 0.12um Technology Devices;Mulder,2004
2. A Simple Polishing Technique for Removing the Entire Metallization Stack for Sub 100nm Device Technologies;Mulder,2013
3. Focused Ion Beam Method for Reconditioning Worn Tungsten Atomic Force Probe Tips;Mulder,2005