Physics of Laser-Based Failure Analysis-Reference-Cited by-同舟云学术

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Physics of Laser-Based Failure Analysis

Published:2019 Issue: Volume: Page:196-208
ISSN:
Container-title:Microelectronics Failure Analysis
language:
Short-container-title:

Author:

Beaudoin Felix,Cole Edward

Publisher

ASM International

Reference29 articles.

1. Optical Beam Induced Current Applications for Failure Analysis of VLSI Devices;Wills,1990

2. Novel Failure Analysis Techniques Using Photon Probing with a Scanning Optical Microscope;Cole,1994

3. New Capabilities of OBIRCH Method for Fault Localization and Defect Detection;Nikawa,1997

4. Backside Localization of Open and Shorted IC Interconnections;Cole,1998

5. Various Contrasts Identifiable from the Backside of a Chip by 1.3μm Laser Beam Scanning and Current Change Imaging;Nikawa,1996

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1. Explainable automated data estimation in Logic State Imaging of embedded SRAM;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19

2. Experimental Characterization of Two-Photon Optical Beam Induced Current Imaging for Microelectronics Assurance;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24

3. Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications;Journal of Electronic Testing;2023-03-28

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