1. Resistive Interconnection Localization;Cole,2001
2. Soft Defect Localization(SDL) on ICs;Bruce,2002
3. Critical timing analysis in microprocessors using near-IR laser assisted device alteration (LADA);Rowlette
4. Shmoo plotting: The black art of IC testing;Baker;IEEE Design & Test of Computers,1997
5. Test Circuit Conditioning for Soft Defect Localization;Staller,2014