Sequential nitrogen ion implantation in Si-based GaAs matrix and subsequent thermal annealing process: electrical characterization
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Published:2019-01-12
Issue:
Volume:
Page:
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ISSN:0370-0046
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Container-title:Proceedings of the Indian National Science Academy
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language:
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Short-container-title:PINSA
Publisher
Indian National Science Academy
Subject
General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology