Estimation of Depth and Length of Defects from Magnetic Flux Leakage Measurements: Verification with Simulations, Experiments, and Pigging data
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/20/4479871/07752913.pdf?arnumber=7752913
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