Analog/Mixed-Signal Circuit Testing Technologies in IoT Era-Reference-Cited by-同舟云学术

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Analog/Mixed-Signal Circuit Testing Technologies in IoT Era

Published:2020-11-03 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
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Author:

Kobayashi Haruo,Kuwana Anna,Wei Jianglin,Zhao Yujie,Katayama Shogo,Tri Tran Minh,Hirai Manato,Nakatani Takayuki,Hatayama Kazumi,Sato Keno,Ishida Takashi,Okamoto Toshiyuki,Ichikawa Tamotsu

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9278127/9278011/09278194.pdf?arnumber=9278194

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design Consideration for LC Analog Filters: Inductor ESR Compensation, Mutual Inductance Effect and Variable Center Frequency;Proceedings of Eighth International Congress on Information and Communication Technology;2023-09-15

2. Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing;IEICE Electronics Express;2023-01-10

3. 12 bit 1 ps Resolution Time-to-Digital Converter for LSI Test System;Proceedings of Eighth International Congress on Information and Communication Technology;2023

4. Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing;IEICE ELECTRON EXPR;2022

5. High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST;2022 IEEE 31st Asian Test Symposium (ATS);2022-11

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