SEM Image Denoising and Contour Image Estimation using Deep Learning-Reference-Cited by-同舟云学术

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SEM Image Denoising and Contour Image Estimation using Deep Learning

Published:2020-08 Issue: Volume: Page:
ISSN:
Container-title:2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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Author:

Chaudhary Narendra¹,Savari Serap A.²,Brackmann Varvara²,Friedrich Michael²

Affiliation:

1. Texas A&M University College Station,Department of Electrical and Computer Engineering,Texas,USA,77843-3128

2. Fraunhofer Institute for Photonic Microsystems,Nano-System Technology Koenigsbruecker Strasse 178,Dresden,01099

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9180248/9185190/09185250.pdf?arnumber=9185250

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM;IEEE Transactions on Instrumentation and Measurement;2023

2. Increasing the Utilization of Deep Neural Networks for SEM Measurements Through Multiple Task Formulation and Visualization;IEEE Transactions on Semiconductor Manufacturing;2020-08

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