An Improved GAN Model Based on Positive Samples for LED Die Defect Detection-Reference-Cited by-同舟云学术

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An Improved GAN Model Based on Positive Samples for LED Die Defect Detection

Published:2022-12-09 Issue: Volume: Page:
ISSN:
Container-title:2022 6th Asian Conference on Artificial Intelligence Technology (ACAIT)
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Author:

Shao Guifang¹,Chen Hongrong¹,Gao Fengqiang¹

Affiliation:

1. Xiamen University,Pen-Tung Sah Institue of Micro-Nano Science and Technology,Xiamen,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10137730/10137768/10137955.pdf?arnumber=10137955

Reference20 articles.

1. Image Quality Assessment: From Error Visibility to Structural Similarity

2. Deep Residual Learning for Image Recognition

3. Surface defect saliency of magnetic tile

4. A Threshold Selection Method from Gray-Level Histograms

5. Weakly supervised learning for industrial optical inspection;wieler;DAGM Symposium,2007

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