Failure Localization of Bipolar Integrated Circuits by Implementing Active Voltage Contrast-Reference-Cited by-同舟云学术

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Failure Localization of Bipolar Integrated Circuits by Implementing Active Voltage Contrast

Published:2021-09-15 Issue: Volume: Page:
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Container-title:2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Author:

Ni Yiqiang,Chen Xuanlong,Li Enliang,Zheng Linting,He Liang,Yang Shizheng

Funder

Research and Development

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9617229/9617230/09617407.pdf?arnumber=9617407

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on the Functional Failure of Large Scale Chips Caused by Recoverable Latch up;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24

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