Leaf Area Index Retrieval for Broadleaf Trees by Envelope Fitting Method Using Terrestrial Laser Scanning Data-Reference-Cited by-同舟云学术

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Leaf Area Index Retrieval for Broadleaf Trees by Envelope Fitting Method Using Terrestrial Laser Scanning Data

Published:2022 Issue: Volume:19 Page:1-5
ISSN:1545-598X
Container-title:IEEE Geoscience and Remote Sensing Letters
language:
Short-container-title:IEEE Geosci. Remote Sensing Lett.

Author:

You Hangkai¹^ORCID,Li Shihua¹^ORCID,Ma Lixia²,Wang Di³^ORCID

Affiliation:

1. School of Resources and Environment, University of Electronic Science and Technology of China, Chengdu, China

2. State Key Laboratory of Soil and Sustainable Agriculture, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, China

3. Department of Remote Sensing Science and Technology, School of Electronic Engineering, Xidian University, Xi’an, China

Funder

National Natural Science Foundation of China

Major Science and Technology Application Demonstration Project of Chengdu

National Key Research and Development Program of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Geotechnical Engineering and Engineering Geology

Link

http://xplorestaging.ieee.org/ielx7/8859/9651998/09917536.pdf?arnumber=9917536

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Retrieval methods for Tree Leaf Area Parameters Based on Terrestrial Laser Scanning;Chinese Journal of Space Science;2023

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