Measurement of Low-Frequency Noise of Modern Low-Noise Junction Field Effect Transistors-Reference-Cited by-同舟云学术

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Measurement of Low-Frequency Noise of Modern Low-Noise Junction Field Effect Transistors

Published:2005-12 Issue:6 Volume:54 Page:2427-2432
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Levinzon F.A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/32946/01542546.pdf?arnumber=1542546

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