Reliability Analysis of Bypass Diodes in Photovoltaic Modules by Using Different Lifetime Estimation Models-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Reliability Analysis of Bypass Diodes in Photovoltaic Modules by Using Different Lifetime Estimation Models

Published:2023-12-30 Issue: Volume: Page:1-8
ISSN:
Container-title:2023 International Conference on Electrical, Communication and Computer Engineering (ICECCE)
language:
Short-container-title:

Author:

Bui Duong Minh¹,Nguyen Hung Tan²,Nguyen Tien Minh³

Affiliation:

1. Vietnamese-German University (VGU),Faculty of Engineering,ECE Department,Vietnam

2. HUTECH University,HUTECH Institute of Engineering,Ho Chi Minh City,Vietnam

3. HCM City University of Industry and Trade,Nha Trang College of Technology,Khanh Hoa,Vietnam

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10441786/10441790/10442789.pdf?arnumber=10442789

Reference21 articles.

1. Mismatch losses in PV power plants

2. Solar bypass diodes: then and now, Solar, Vol;Fahrenbruch,2010

3. Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System

4. Predicting thermal runaway in bypass diodes in photovoltaic modules

5. High temperature reverse by-pass diodes bias and failures;Posbic

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP