Reliability Assessment of Bypass Diodes in Photovoltaic Systems Based on Accumulated Damage Calculation Models-Reference-Cited by-同舟云学术

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Reliability Assessment of Bypass Diodes in Photovoltaic Systems Based on Accumulated Damage Calculation Models

Published:2023-12-30 Issue: Volume: Page:1-8
ISSN:
Container-title:2023 International Conference on Electrical, Communication and Computer Engineering (ICECCE)
language:
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Author:

Bui Duong Minh¹,Nguyen Hung Tan²,Le Phuc Duy³

Affiliation:

1. Vietnamese-German University (VGU),Faculty of Engineering,ECE Department,Vietnam

2. HUTECH University,HUTECH Institute of Engineering,Ho Chi Minh City,Vietnam

3. Industrial University of Ho Chi Minh City,Faculty of Electrical Engineering Technology,Ho Chi Minh City,Vietnam

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10441786/10441790/10442296.pdf?arnumber=10442296

Reference19 articles.

1. Solar bypass diodes: then and now, Solar, Vol;Fahrenbruch,2010

2. Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System

3. Predicting thermal runaway in bypass diodes in photovoltaic modules

4. High temperature reverse by-pass diodes bias and failures;Posbic

5. The reliability of bypass diodes in PV modules

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