Modeling the Interactions Among Neighboring Nanostructures for Local Feature Characterization and Defect Detection-Reference-Cited by-同舟云学术

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Modeling the Interactions Among Neighboring Nanostructures for Local Feature Characterization and Defect Detection

Published:2012-10 Issue:4 Volume:9 Page:745-754
ISSN:1545-5955
Container-title:IEEE Transactions on Automation Science and Engineering
language:
Short-container-title:IEEE Trans. Automat. Sci. Eng.

Author:

Xu Lijuan,Huang Qiang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx5/8856/6319440/06269088.pdf?arnumber=6269088

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