A A Integrated Current-Sensing System With % Gain Error and 16 μA Offset From to-Reference-Cited by-同舟云学术

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A A Integrated Current-Sensing System With % Gain Error and 16 μA Offset From to

Published:2016-04 Issue:4 Volume:51 Page:800-808
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/7446371/7384698.pdf?arnumber=7384698

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Integrated Metal Shunt with Matched Sensing Resistor for High-Side Current Sensing;ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC);2023-09-11

2. A SAR-assisted Incremental $\Sigma\Delta$ ADC with Accumulation-based S/H Circuit for Shunt Current Measurements;2023 IEEE International Symposium on Circuits and Systems (ISCAS);2023-05-21

3. An on-chip integrated current sensor with high precision and large current range for smart power ICs;Microelectronics Journal;2023-04

4. A novel-16–60 V input common-mode voltage current-shunt monitor;Microelectronics Journal;2023-01

5. Analysis of Residual Error from Amplifier Offset Chopping in Incremental ΔΣ ADCs Without Decimation Filter Synchronization;IEEE Transactions on Circuits and Systems II: Express Briefs;2023

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