Prediction of Capacitor’s Accelerated Aging Based on Advanced Measurements and Deep Neural Network Techniques-Reference-Cited by-同舟云学术

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Prediction of Capacitor’s Accelerated Aging Based on Advanced Measurements and Deep Neural Network Techniques

Published:2020-11 Issue:11 Volume:69 Page:9019-9027
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Liu Hao^ORCID,Claeys Tim^ORCID,Pissoort Davy^ORCID,Vandenbosch Guy A. E.^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/9218027/09113716.pdf?arnumber=9113716

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