Author:
Carbone P.,Schoukens J.,De Angelis A.,Moschitta A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Cited by
2 articles.
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1. One-Bit Constrained Measurements of Parametric Signals;IEEE Transactions on Instrumentation and Measurement;2022
2. One-Bit Sine-Fit;IEEE Transactions on Instrumentation and Measurement;2021