Historical Information-Aided Monitoring of Few-Sample Modes in Industrial Processes With Orthogonal Transferred Projection-Reference-Cited by-同舟云学术

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Historical Information-Aided Monitoring of Few-Sample Modes in Industrial Processes With Orthogonal Transferred Projection

Published:2024-08 Issue:8 Volume:20 Page:10375-10386
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Wang Kai¹^ORCID,Lei Xiang¹^ORCID,Zhou Wenxuan¹^ORCID,Cheng Saige¹^ORCID,Li Jing²^ORCID

Affiliation:

1. School of Automation, Central South University, Changsha, China

2. Institute of High-Performance Computing, Agency for Science, Technology and Research, Singapore and the Centre for Frontier AI Research, Agency for Science, Technology and Research, Singapore

Funder

National Natural Science Foundation of China

Natural Science Foundation of Hainan Province

Central South University Innovation-Driven Research Program, Changsha in China

Maritime AI Research Programme of Singapore

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/9424/10623532/10529115.pdf?arnumber=10529115

Reference35 articles.

1. Deep Neural Network-Embedded Stochastic Nonlinear State-Space Models and Their Applications to Process Monitoring

2. Transfer Dictionary Learning Method for Cross-Domain Multimode Process Monitoring and Fault Isolation

3. Data-Driven Process Monitoring Based on Modified Orthogonal Projections to Latent Structures

4. Performance-Driven Distributed PCA Process Monitoring Based on Fault-Relevant Variable Selection and Bayesian Inference

5. Fault detection of uncertain chemical processes using interval partial least squares-based generalized likelihood ratio test

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