Measurement of Electromagnetic Property of Dielectric Material Based on Transmission/Reflection Method-Reference-Cited by-同舟云学术

Measurement of Electromagnetic Property of Dielectric Material Based on Transmission/Reflection Method

Published:2023-04-25 Issue: Volume: Page:
ISSN:
Container-title:2023 24th International Vacuum Electronics Conference (IVEC)
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Author:

Ziyao Wei¹,Zhongming Zeng²,Zhanliang Wang³

Affiliation:

1. School of microelectronics, University of Science and Technology of China,Hefei,China

2. Suzhou Institute of Nano-Tech and Nano-Bionics, University of Chinese Academy of Sciences,Suzhou,China

3. School of Electronic Science and Engineering, University of Electronic Science and Technology of China,Chengdu,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10156868/10156872/10157058.pdf?arnumber=10157058

Reference5 articles.

1. Transmission/reflection and short-circuit line methods for measuring permittivity and permeability[J];baker-jarvis;NASA STI/Recon Technical Report N,1993

2. Measurement System for Evaluating Dielectric Permittivity of Granular Materials in the 1.7–2.6-GHz Band

3. Improved NR W Transmission/Reflection Method for the Determination of Electromagnetic Parameters of Materials With Coaxial Line[J];cai-jun;measurement & control technology,2009

4. Techniques of microwave permeability characterization for thin films*

5. Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques

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