Surface characterization of new and aged semiconducting glazes-Reference-Cited by-同舟云学术

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Surface characterization of new and aged semiconducting glazes

Published:2003-06 Issue:3 Volume:10 Page:375-384
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:en
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Ullrich H.,Gubanski S.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/94/27149/01207460.pdf?arnumber=1207460

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application of Self‐Cleaning Ceramic and Glass Insulators for Electricity Transmission;Handbook of Self‐Cleaning Surfaces and Materials;2023-04-21

2. Understanding surface degradation on polymeric insulators using rotating wheel and dip test under DC stress;IEEE Transactions on Dielectrics and Electrical Insulation;2018-10

3. Accelerated aging studies of silicon-rubber based polymeric insulators used for HV transmission lines;Polymer Testing;2017-09

4. Study on glaze electrical erosion characteristics of porcelain post insulator by using inclined plane and graphite-layer-based method;IEEE Transactions on Dielectrics and Electrical Insulation;2015-12

5. Influence of temperature and electron irradiation on the surface composition of a silicate semiconducting glaze;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2013-11

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