Author:
Mahmod Jubayer,Millican Spencer,Guin Ujjwal,Agrawal Vishwani
Cited by
7 articles.
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1. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis;2023 IEEE International Test Conference (ITC);2023-10-07
3. Delay Testable Design Using Modified Boundary Scan;Journal of The Japan Institute of Electronics Packaging;2021-11-01
4. Using Model Checker to Analyze and Test Digital Circuits with Regard to Delay Faults;2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2021-04-07
5. New Perspectives on Core In-field Path Delay Test;2020 IEEE International Test Conference (ITC);2020-11-01